Electron microscopes
use a beam of e- with wavelengths less than 1nm to illuminate the specimen
-> allowing for greater detail of cell ultrastructure than a light microscope
Scanning Electron Microscope
SEM
-A beam of e- is passed through the specimen and onto the detector at the bottom which generates an image
! the detector can be a separate tube in diagrams
X500,000 max magnification
0.5 nm resolving power
black and white image
2D
internal structures (from slices of the specimen)
specimens are dead
Transmission Electron Microscope
TEM
-a beam of e- is sent onto the specimen, reflected electrons are detected by the detector which generates an image
X500,000 max magnification
3-10 nm resolving power
black and white image
3D
external structures
specimens are dead